As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://marriagebureauindelhi53085.blogdemls.com/39291442/understanding-static-timing-analysis-as-a-core-skill-in-vlsi-engineering